Resistant to temperature changes: this will be the future of PUFs

From the Instituto de Microelectrónica de Sevilla (IMSE-CNM) we are pleased to announce the recent publication by the journal IEEE Transactions on Circuits and Systems I: Regular Papers of the article entitled "A Comprehensive Approach to Improving the Thermal Reliability of RTN-Based PUFs" to which researchers from our center have contributed.

In this study, hardware security is presented as a "low-cost" alternative to protect our data from third parties, especially in a world where cyberattacks are increasingly common. In particular, Physical Unclonable Functions (PUFs), which are the "fingerprints" of electronic devices, are presented as an interesting option to generate cryptographic keys to protect communications between people. However, and although their useful life is long, heat or cold can alter their operation. To solve this problem, the study proposes certain methods that allow these systems to continue working properly, even when the temperature changes, expanding the range of applicability of these devices.

From IMSE we would like to congratulate Fernando de los Santos, Francisco J. Rubio, Rafael Castro, Elisenda Roca and Francisco V. Fernández for this research and congratulate them for the subsequent publication in one of the most highly valued media in the scientific community.