A Semiconductor Test System
The Agilent 93000 SOC C2OOe Semiconductor Test System allows carrying out prototyping and fabrication tests of mixed-signal circuits (either already packaged or directly onto the wafer) in one only platform. It is also possible to incorporate the inTest ATS-505, a temperature forcing system that allows to perform the tests under temperature conditions ranging from -20ºC to +225ºC.
