Device Characterization Lab

This laboratory is mainly dedicated to perform parametric measurements in semiconductors and passive devices. In this lab it is possible to acquire internal signals from the semiconductors, already cutted and packaged, or from wafers up to 3.5", and performing tests at temperatures ranging from -125ºC to 150ºC.

Chief Lab Technician

Antonio Ragel Morales >


  • Semiconductor Parameter Analyzers
  • Climatic Chamber
  • Probe Station
  • Temperature Forcing System
  • C Meter CV Plotter
  • LCR Meter

Labs & Workshops