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Author: Gutiérrez Gil , Valentín
Year: Since 2002
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AMS-RF test quality: Assessing defect severity
V. Guiterrez, A. Gines and G. Leger
Conference - IEEE Int. Symposium on On-Line Testing and Robust System Design IOLTS 2018
[abstract]
In safety critical applications there is a demand for estimating defect coverage in order to meet stringent quality levels. However, defect simulation of complex AMS-RF circuits is computationally expensive since achieving good confidence interval requires sampling many defects. In this paper, we show on a practical case of study that it may be beneficial to complement defect coverage with fault coverage and assess the severity of defect escapes to get a complete picture of test quality.

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