A Comprehensive Approach to Improving the Thermal Reliability of RTN-Based PUFs F. de los Santos-Prieto, F.J. Rubio-Barbero, R. Castro-López, E. Roca and F.V. Fernández Journal Paper · IEEE Transactions on Circuits and Systems I: Regular Papers (Early Access), 2024 resumendoi
Silicon Physical Unclonable Functions (PUFs) have emerged as a promising solution for generating cryptographic keys in low-cost resource-constrained devices. A PUF is expected to be reliable, meaning that its response bits should remain consistent each time the corresponding challenges are queried. Unfortunately, the stability of these challenge-response pairs (CRPs) can be seriously eroded by environmental factors like temperature variations and the aging of the integrated circuits implementing the PUF. Several approaches, including bit masking, bit selection techniques, and error-correcting codes, have been proposed to obtain a reliable PUF operation in the face of temperature variations. As for aging, a new kind of aging-resilient silicon PUF has been reported that uses the time-varying phenomenon known as Random Telegraph Noise (RTN) as the underlying entropy source. Although this type of PUF preserves its reliability well when aged, it is not immune to the impact of temperature variations. The work presented here shows that it is possible to improve the thermal reliability of RTN-based PUFs with a proper combination of (a) a novel optimization-based bit selection technique, that is also applicable to other types of PUFs based on differential measurements; and (b) a temperature-aware tuning of the entropy-harvesting function.
